Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Niozu, A.; Kumagai, Y.; Nishiyama, T.; Fukuzawa, H.; Motomura, K.; Bucher, M.; Ito, Y.; Takanashi, T.; Asa, K.; Sato, Y.; You, D.; Li, Y.; Ono, T.; Kukk, E.; Miron, C.; Neagu, L.; Callegari, C.; Di Fraia, M.; Rossi, G.; Galli, D. E.; Pincelli, T.; Colombo, A.; Kameshima, T.; Joti, Y.; Hatsui, T.; Owada, S.; Katayama, T.; Togashi, T.; Tono, K.; Yabashi, M.; Matsuda, K.; Bostedt, C.; Nagaya, K.; Ueda, K.
2020

Abstract

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Details

Title Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Author(s) Niozu, A. ; Kumagai, Y. ; Nishiyama, T. ; Fukuzawa, H. ; Motomura, K. ; Bucher, M. ; Ito, Y. ; Takanashi, T. ; Asa, K. ; Sato, Y. ; You, D. ; Li, Y. ; Ono, T. ; Kukk, E. ; Miron, C. ; Neagu, L. ; Callegari, C. ; Di Fraia, M. ; Rossi, G. ; Galli, D. E. ; Pincelli, T. ; Colombo, A. ; Kameshima, T. ; Joti, Y. ; Hatsui, T. ; Owada, S. ; Katayama, T. ; Togashi, T. ; Tono, K. ; Yabashi, M. ; Matsuda, K. ; Bostedt, C. ; Nagaya, K. ; Ueda, K.
Published in 31St International Conference On Photonic, Electronic And Atomic Collisions (Icpeac Xxxi)
Series Journal of Physics Conference Series
Volume 1412
Pages 202028
Conference 31st International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC), Jul 23-30, 2019, Deauville, FRANCE
Date 2020-01-01
Publisher Bristol, IOP PUBLISHING LTD
DOI https://doi.org/10.1088/1742-6596/1412/20/202028
Other identifier(s) View record in Web of Science
Laboratories ELAB
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > ELAB - Electronics Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date 2021-06-19